实验技术与管理

高端科学仪器是高等学校和科研院所开展科研创新工作的重要条件支撑，针对我国高端科学仪器长期依赖进口、核心技术研发和关键零部件研制能力不足、科学仪器研发生产与实际应用脱节的问题，文章以桌面式X射线吸收精细结构谱仪为例，详述了国产科学仪器研究及应用示范中心以科研测试需求的应用场景为驱动，实现多项仪器功能与性能的突破，推动高端科学仪器的研发以及应用方法的开发与创新，从应用端推动国产仪器厂家技术迭代升级，探索建立国产科学仪器研发与应用的平台和桥梁，加快培育国产科学仪器的新质生产力。

[Objective] High-end scientific instruments are essential infrastructure for supporting research and innovation in higher education institutions and research organizations. However, the high-end scientific instrument sector in China has long depended on imports, where domestic research and development(R&D) has primarily focused on replicating international advancements. Other challenges facing the industry include the disconnection between R&D, manufacturing, and practical applications, as well as limitations in core technology development and key component manufacturing capabilities. This study examines benchtop X-ray absorption fine structure(XAFS) spectrometers as a case study for illustrating how the Domestic Scientific Instrument Research and Application Demonstration Center(hereinafter referred to as the “Demonstration Center”) has facilitated breakthroughs in instrumental functionality and performance. The center prioritizes scientific testing based on the requirements of application scenarios to promote the R&D of highend scientific instruments, enhance application methodologies, drive technological advancements in domestic instrument manufacturing, establish collaboration platforms for instrument development and application, and accelerate the growth of new productive forces in the scientific instrument industry of China. [Progress] In collaboration with the Advanced Instrumental Analysis Center of the School of Chemical Engineering and Technology at Tianjin University, the Demonstration Center proposed strategies for enhancing the performance of existing XAFS spectrometers, including innovations in experimental methods, functional improvements, and the development of accessories. These efforts were supported by engineers and researchers with extensive expertise in catalyst characterization. The key advancements include:(1)Optimizing the detection of metals at low-loading levels. Hardware upgrades: Replacing conventional Si(553) crystal monochromators with Ge(800) counterparts enhanced the photon flux by a factor of 2～3. Integrating stainless steel apertures effectively filtered stray X-ray signals and significantly improved the signal-to-noise ratio. Methodological innovations: Advancements in sample preparation techniques, including cryogenic ball milling, as well as increasing the number of repetitive scanning cycles, optimizing the step sizes used in the tests, and extending the edge acquisition times enabled precise XAFS characterization of CuO_x/V₂O₅ catalysts with Cu loadings as low as 3.0 at%. The achieved data quality was comparable to that of the imported instruments. Application validation: The optimized XAFS methodology provided critical insights into the coordination environment of the species in Cu—O—V bonds and the valence-state distribution of the Cu species, enabling the elucidation of key structure-performance relationships in the catalysts. Relevant findings have been published in high-impact journals such as Applied Catalysis B: Environment and Energy.(2)Development of in-situ electrocatalytic testing systems. Self-designed reaction cell: A compact in-situ electrochemical cell(3 cm thick) was developed using polyaryletherketone(PAEK) to optimize the X-ray transmittance and control the electrolyte thickness, effectively mitigating signal attenuation challenges during dynamic testing. Analysis of dynamic mechanism: The dynamic mechanism of the formation of Cu—O—Ti bonds during electrochemical oxidation was elucidated through real-time monitoring of the Cu and Ti K-edge XANES/EXAFS spectra, providing direct experimental evidence for the rational design of high-efficiency catalysts. These findings have been published in journals such as the Journal of Materials Chemistry A. [Conclusions and Prospects] This study outlines advancements in the applications of XAFS spectrometers and the development of key components facilitated by the Demonstration Center. Currently, the center is driving the iterative enhancement of eight categories of domestically developed scientific instruments, including benchtop X-ray absorption fine structure spectrometers, in-situ liquid-phase transmission electron microscopy(TEM) systems, in-situ electrical TEM systems, Fourier-transform infrared spectrometers, and miniature in-situ mechanical testing systems. The center will continue to prioritize application-driven technological advancements, foster innovation in domestic instrument manufacturing through end-user testing demands, and strengthen the integration of the scientific instrument industry with research and academic innovation networks. These efforts aim to accelerate breakthroughs in domestically developed scientific instruments, enhance R&D efficiency, and promote the rapid deployment of homegrown technologies. By establishing a synergistic ecosystem that connects industry, academia, research, and application, the Demonstration Center is poised to play a crucial role in achieving full domestic substitution of high-end scientific instruments and enhancing the scientific and technological competitiveness of China.